Functional test proposal for switched capacitor bandpass filters embedded in reconfigurable systems on chip

Abstract

This work presents a functional test proposal for switched capacitor bandpass filters implemented on analog reconfigurable hardware of mixed – signal systems on chip, based on transient response analysis. The proposed scheme places stimuli generation inside the chip under test, reducing thus, the instrumental overhead. The test scheme was validated through simulation of the complete test environment. The results achieved are encouraging for the application of the strategy, having found low minimal differences between the functional parameters obtained through the strategy and the nominal ones.