Functional and Structural Test Proposal for Analog Filters Embedded in Reconfigurable Hardware Based on Transient Response Analysis

Abstract

This work introduces a low-cost test strategy based on transient response analysis for analog filters embedded in Cypress® Semiconductor PSoC1 devices. The proposal has associated a low cost and can be used for field maintenance.
The test solution consists of setting PSoC1 reconfigurable blocks as second-order low pass filters and evaluating theirtransient response. Test stimuli are generated internally, while the response is processed using an oscilloscope and next, on a PC. The ability of the strategy to determine filter specifications with low errors and dispersions is demonstrated experimentally. Furthermore, it can detect all faults introduced by the reconfiguration of the device resources. However, to evaluate its capability of detecting faults in components not accessible by the user, a simulation model of the circuits under test is proposed. Preliminary results indicate a good degree of correlation between the real and the simulated filter, with and without faults.